pISSN 2234-7518
eISSN 2005-372X

Cephalometric measurements

Measurement Pretreatment Posttreatment Retention 1 year Retention 3.5 years
SNA (°) 83.2 83.2 83.7 83.4
SNB (°) 88.2 85.5 86.4 86.4
ANB (°) −5.0 −2.3 −2.7 −3.0
Wits appraisal (mm) −9.7 −7.7 −7.1 −7.4
ANS-PNS (mm) 56.2 56.2 56.0 55.7
Go-Me to FH plane (°) 19.1 22.4 21.0 20.9
Y-axis (°) 56.4 59.5 58.5 58.4
ANS-Me (mm) 74.2 80.2 78.8 78.7
Overjet (mm) −5.2 5.6 5.7 5.1
Overbite (mm) 9.8 3.0 3.3 2.8
U1 to FH plane (°) 113.0 123.9 125.5 126.0
U1 to SN plane (°) 106.2 117.0 118.9 119.5
L1 to Go-Me (°) 75.6 69.2 68.7 70.3
Nasolabial angle (°) 81.2 92.1 89.4 90.0
UL to E-line (mm) −4.2 −1.0 −2.3 −3.7
LL to E-line (mm) 2.6 1.4 1.2 0.7

SNA, sella-nasion-A point; SNB, sella-nasion-B point; ANB, A point-nasion-B point; ANS, anterior nasal spine; PNS, posterior nasal spine; Go, gonion; Me, menton; FH plane, Frankfort horizontal plane; U1, upper incisor; SN, sella-nasion; L1, lower incisor; UL, upper lip; LL, lower lip.

Korean J Orthod 2022;52:362~371 https://doi.org/10.4041/kjod22.023
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